ESD Control Program DOD-STD-1686 1980.pdf

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MILITARY
STANDARD
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ELECTROSTATIC
DISCHARGE
CONTROL
PROGRAM
FOR
PROTECTION OF ELEaRICAL AND ELECTRONIC PARTS,
ASSEMBLIES AND EQUIPMENT (EXCLUDING ELECTRICALLY
INITIATED
EXPLOSIVE
DEVICES)
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Downloaded from http://www.everyspec.com
DOD- STD-1686
2 May 1980
DEPARTMENT
Washington,
OF DEFENSE
20362
D.C.
ELECTROSTATIC DISCRARGE CONTROL PROGRAM FOR PROTECTION OF
ELECTRICAL AND ELECTRONIC PARTS , ASSEMBLIES AND EQUIPMENT
(Excluding Electrically-Initiated
Explosive Devices)
1. This Military Standard
agencies of the Department
is approved
of Defense.
for use by all Departments
and
2. Beneficial commeuts (recommendations, add it ions, delet ions ) and any
pertinent data which may be of use in improving this document should be
addressed to: Commander, Naval Sea Systems Command, ATTN: Code 3112,
Washington, D.C. 20362, by using the self-addressed Standardization Document
Improvement Proposal (DD Form 1426) appearing at the end of this document,
or by letter.
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DOD- STD-1686
2 May 1980
FOREWORD
This standard covers the establishment
and implementation’ of an
Electrostatic Discharge
(EsD) Control Program for any activity that de-
processes, assembles, in-
signs, tests, inspects, services, manufactures,
stalls, packages, labels, or otherwise handles electrical or electronic
parts susceptible to dauuage caused by static electricity.
This standard
does not apply to electrically initiated explosive devices.
DOD-HDBK-263
provides information ,for implementing the requirements of this standard.
ESD is generated by the relative motion or separation of materials
or flow of liquids, vapors or gases.
Common sources of ESD include per-
sonnel, items made of plain plastics, and processing equipment.
ESD can
damage parta by direct contact with a charged source or from charges in-
duced by an electrostatic
field.
ESD sensitive (ESDS) parts include:
microcircuits,
discrete semiconductors,
thick and thin film resistors,
chips, hybrid devices and piezoelectric
crystals depending upon the magni-
tude and shape of the ESD pulse.
This document limits the control program to only the more sensitive
ESDS parts which are susceptible to damage from “personnel discharges of up
to 4,000 volts.
Voltages greater than 4,000 volts can be generated re-
sulting in damage to parts which are less sensitive to ESD.
The contractor
should consider added precautions where parts of lower ESD se.neitivity
(see DoD-RoBK-263
for parta susceptible to damage from personnel charged
up to 15,000 volts) can be sxposed to voltage levels in excess of 4,000
volts, or where experience or other requirements indicate unde$i,rable risk
of damage to these parts.
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DOD- STD-1686
2 May 1980
‘TABLE OF CONTENTS
Paragraph
1.
1.1
1.2
1.3
1.4
2.
2.1
3.
4.
4.1
5.
5.1
5.1.1
5.1.2
5.2
5.2.1
5.2.2
5.3
5.4
5.5
5.6
5.7
5.8
5.8.1
5.8.1.1
5.8.1.2
5.8.2
5.8.2.1
5.8.2.2
5.9
5.10
5.10.1
5.10.2
5.11
6.
6.1
6.2
6.3
SCOPE —— --------------------------------------
Scope ----------------------------------------
—-
pu=po~e ------------------------------
Appl icat ion ----------------------------------
Class if icat ion -------------------------------
REFERRNCRD DOCOMRNTS ---------------------------
Issues of docuwnts
--------------------------
DEFINITIONS ------------------------------------
GRNPRAL BEQUIRRMENTS ---------------------------
General --------------------------------------
DETAILED REQUIBEIC?NTS --------------------------
Identification and classification of
ESDS items ---< -----------------------------
Psrts ----------------------------------------
Assemblies and equipment ---------------------
Design protection ------------------—
--------
Protection of parts and assemblies -----------
Protection of equipment cabinet terminals ----
protected areas ------------------------------
Randling procedures --------------------------
Protective covering --------------------------
Installation sit e ----------------------------
Training -------------------------------------
Marking --------------------------------------
Doc_ntati.an
--------------------------------
Deliverables ---------------------------------
Non-deliv&ables
---—----------------------—
Hardware -------------------------------------
Assemblies ---------------------------------—
Rquipment enclosures -------------------------
Quality assurance provisions -----------------
Audits and reviews ---------------------------
Design reviews -------------------------------
Program reviews ------------------------------
Packaging for delive~
-----------------------
TAILORING --------------------------------------
High reliabilityy or critical programs --------
Reacquisition --------------------------------
Applicability to government activities -------
TABLES
Table
I.
II.
III.
ES13 control pmgran
---------------------- ------
List of ESDS parts by part type ----------------
Pin combinations for ESD test$ng ---------------
FIGURES
Figure
1.
2.
3.
ESD test circuit -----------------------------—
Critical path determination --------------------
Classification testing -------------------------
B-2
B-3,
B-6
2
A-2
B-4
-
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1
1
3
3
3
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3
4
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DOD- STD-1686
2 May 1980
TABLE OF CONTENTS
(Continued)
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APPENDIX
Paragraph
10.
10.1
20.
20.1
30.
40.
40.1
50.
50.1
50.2
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1,
GENESAL SEQUIRBMENTS --------------------------
-------------
General --------------—--
REFBSENCED DOCUMENTS ------------------—--—
Issues of documents ------------------------
DEFINITIONS -----------------------------------
G~w
REQUIREMENTS -—----—----—
-----------
*pp~@t.n
-_---__-------__-.__--------:
DETAIL RSQUIRBMENTS -—------------------------
‘Class 1 and Class 2 parts ——----——
-----
Otlier parts --------------------------------
AFPBNDIX
B
A-1
A-1
A-1
A-1
A-1
A-1
A-1
A-1
A-1
A-3
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Paragraph
10.
10.1
20.
30.
40.
40.1
50.
50.1
50.1.1
50.1.2’
50.1.3
50.2
50.3
GEN@iL
REQUIREMENTS -------— -----------------
General -----——----—--------------—----
REFERENCED DOCUfiliNTS-------------------------
DEFINITIONS ---------—-----------—---—’—---
GFNE&%
REQUIREMENTS -----------—-----------—
General -------—------—
--------------------
D~AIL
SEQU IBEMENTs ----------—----—-—-—--
General -------------------------------------
Test circuit ----— --------------------------
Part funct ion testing -----------------------
Part failure --------------------------------
Determination of critical failure path ------
T&t ing -------------------------------------
B-1
B-1
B-1
B-1
B-1
B-1
B-1
B-1
B-1
B-1
B-1
B-1
B-5
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